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Papers by Author: W. Warta

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Carrier Density Imaging as a Tool for Characterising the Electrical Activity of Defects in Pre-Processed Multicrystalline Silicon

Authors: Stephan Riepe, G. Stokkan, T. Kieliba, W. Warta

229

Lifetime and Material Characteristics of Multicrystalline Silicon Measured with High Spatial Resolution

Authors: Stephan W. Glunz, C. Hebling, W. Warta

69

Properties of Multicrystalline Silicon Heat Treated by Classical and Rapid Thermal Processing

Authors: W. Warta, Stephan W. Glunz, A.B. Sproul, H. Lautenschlager, I. Reis, R. Schindler

415