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Articles by author: Wulf Pfeiffer

• A Method for the Determinantion of Weight Factors for Quantitative Phase Analysis using Dual Phase Starting Powders with Application to α / β - Silicon Nitride
  Published in: European Powder Diffraction (p45)
• Acceptor-Hydrogen Interaction in Ternary III-V Semiconductors
  Published in: Defects in Semiconductors 18 (p987)
• Annealing of Damage in GaAs and InP after Implantation of Cd and In
  Published in: Defects in Semiconductors 16 (p1481)
• Doping of ZnSe, ZnTe, and CdTe with Group V Elements
  Published in: Defects in Semiconductors 18 (p309)
• Radioactive Isotopes in Photoluminescence Experiemts: Identification of Defects Levels
  Published in: Defects in Semiconductors 18 (p1503)
• Residual Stresses and Strength of Hard Chromium Coatings
  Published in: Residual Stresses VIII (p133)
• Residual Stresses and Strength of Shot Peened Silicon Nitride Ceramics
  Published in: Residual Stresses VII, ICRS7 (p521)
• Shot Peening of Brittle Materials - Status and Outlook
  Published in: THERMEC 2009 (p799)
• Spectroscopy of Hydrogen-Related Defects in III-V Semiconductors by Nuclear Techniques
  Published in: Hydrogen in Compound Semiconductors (p481)
• Strengthening of Ceramics by Shot Peening
  Published in: Residual Stresses VI, ECRS6 (p101)
• Study of Indium Implanted GaAs: Positron Annihilation and Electrical Measurements
  Published in: Defects in Semiconductors 17 (p305)