Papers by Author: Y.H. Kim

Abstract: A thin electrode layer at the interface between two dissimilar linear piezoelectric materials under electromechanical loading is investigated. The complex function theory is employed to obtain the exact solution to a finite thin conductive layer. Special consideration is devoted to the structure of singular stress and electric fields near the tip of the thin electrode between two dissimilar piezoelectric materials. The stress and electric field are found to have an inverse square root singularity. The electric field intensity factor characterizes uniquely the singular fields close to the edge of the conductive line sheet.

Abstract: A crack on the conductive interface between two dissimilar piezoelectric ceramics under electromechanical loading is investigated. The closed form of the singular crack tip fields for the interface crack is derived here using an analysis based on analytic functions. It is shown that the interfacial crack-tip field consists of a pair of oscillatory singularities. A closed form of the solution for a finite crack on the conductive interface between dissimilar piezoelectric media is also derived.