Papers by Keyword: Charge State

Abstract: We present results of defect formation energies and charge state thermodynamic transition levels of Mg and Te interstitials in MgTe wurzite structure. We use the generalized gradient approximation and local density approximation functionals in the framework of density functional theory for all calculations. The formation energies of the Mg and Te interstitials in MgTe for both the tetrahedral and hexagonal configurations were obtained. The Mg and Te interstitials in MgTe depending on the functional, introduced transition state levels that are either donor or acceptor within the band gap of the MgTe. The Te interstitial exhibit charge states controlled metastability, negative-U and DX centre properties. The Mg interstitial acts as deep or shallow donor and there is no evidence of acceptor levels found for the Mg interstitial.

Abstract: This paper proposes an equalizer for serially connected Lithium-ion battery cells. The battery cell with the lowest state of charge (SOC) is charged by the equalizer during the process of charging and discharging, and the balancing current is constant and controllable. Three unbalanced lithium-ion battery cells in series are selected as the experimental object by this paper. The discharging current under a certain UDDS and 20A charging current are used to complete respectively one time balancing experiment of discharging and charging to the three lithium-ion battery cells. The validity of the balancing strategy is confirmed in this paper according to the experimental results.

Abstract: We employed Laplace transform deep level transient spectroscopy (LDLTS) for the resolution of the EH6/7 center in n-type 4H-SiC epilayers. Our results suggest that this technique is effective in separating the emission rates of the EH6 and EH7 levels. From the Arrhenius dependence of the emission rates we could estimate the energy position of EH6 and EH7 as 1.39 and 1.49 eV below the minimum of the conduction band edge, respectively. Generation of of EH6 and EH7 centers by low-energy electron irradiation (dose dependence) was also investigated. At last, a double pulse Laplace DLTS is performed in order to show the electric filed dependence of the emission rates of EH6 and EH7.

Abstract: Deep Level Transient Spectroscopy (DLTS) and Double-correlated DLTS (DDLTS) measurements have been conducted on Schottky contacts fabricated on n-type 4H-SiC epilayers using different contact metals in order to separate the EH₆- and EH₇-centers, which usually appear as a broad double peak in DLTS spectra. The activation energy of EH₆ (E_C - E_T(EH₆) = 1.203 eV) turns out to be independent of the electric field. As a consequence, EH₆ is acceptor-like according to the missing Poole-Frenkel effect. Therefore, it can be excluded that the EH₆-center and the prominent acceptor-like Z_1/2-center belong to different charge states of the same microscopic defect as theoretically suggested. It is proposed that EH₆ is a complex containing a carbon vacancy and another component available at high concentrations. The activation energy of EH₇ (E_C - E_T(EH₇) = 1.58 eV) has been evaluated indirectly by fitting the DLTS spectra of the EH_6/7 double peak taking the previously determined parameters of EH₆ into account.

Abstract: Ion implantation of different dopants (donors and acceptors) into crystalline silicon with subsequent thermal annealing is used for the formation of ultra-shallow p-n junctions in VLSI technology. The experimentally observed phenomenon of transient enhanced diffusion (TED) during annealing hinders further downscaling of advanced VLSI circuits. However, modern mathematical models of dopant diffusion, which are based on the so-called “five-stream” approach, and software packages such as SUPREM4 encounter difficulties in describing TED. In this work, an extended five-stream model for diffusion in silicon is developed, which takes into account all the possible charge states of point defects (vacancies and silicon self-interstitials) and diffusing pairs “dopant atom–vacancy” and “dopant atom–silicon self-interstitial”. The model includes diffusion and drift of differently charged point defects and pairs in the internal electric field and the kinetics of interaction between unlike species. The expressions for diffusion fluxes and sink/source terms that appear in the non-linear, non-steady-state reaction-diffusion equations are derived for both donor and acceptor dopants accounting for multiple charge states of the diffusing species.