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Articles by keyword: «Conductive AFM»

• Characterization of Resistivity of Sb₂S₃ Semiconductor Nanowires by Conductive AFM and In Situ Methods
  Published in: Global Research and Education (p106)
• Demonstration of Defect-Induced Limitations on the Properties of Au/3C-SiC Schottky Barrier Diodes
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p331)
• Electrical Activity of Structural Defects in 3C-SiC
  Published in: Silicon Carbide and Related Materials 2010 (p273)
• Electrical Imaging Map on Polycrystalline Diamond Films and Diodes and Structural Relationship Obtained by Micro-Raman
  Published in: Advanced Materials Forum III (p48)
• Nano-Electro-Structural Evolution of Ni-Si Ohmic Contacts to 3C-SiC
  Published in: Silicon Carbide and Related Materials 2008 (p569)
• Ti Thickness Influence for Ti/Ni Ohmic Contacts on N-Type 3C-SiC
  Published in: HeteroSiC & WASMPE 2011 (p179)