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Articles by keyword: «Electron Energy Loss Spectroscopy (EELS)»

• Atomic and Electronic Structures of Cu/Sapphire Interfaces by HRTEM and EELS Analyses
  Published in: PRICM-5 (p3859)
• Atomic Interface Structure of Superplastic Ceramics
  Published in: The Science of Engineering Ceramics II (p549)
• Atomic-Scale Studies of the Electronic Structure of Ceramic/Metal Interfaces:{222}MgO/Cu
  Published in: Intergranular and Interphase Boundaries in Materials (p99)
• Extremely Efficient Electron Stimulated Desorption of Hydrogen from GaN(0001)
  Published in: Silicon Carbide and Related Materials - 1999 (p1537)
• Hydrogen Quasi-Chemically Trapped between Defective Graphene Layers in Nanostructured Graphite
  Published in: PRICM 6 (p1585)
• Microstructure and Interfaces of Thin Film Capacitors on Base Metal Foils
  Published in: Smart Materials (p917)
• Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon
  Published in: PRICM 6 (p1127)
• Observations on Diffuse Scattering in a Ti₅₀Ni₄₈Fe₂ Alloy by Energy-Filtering TEM
  Published in: Shape Memory Materials (p441)
• Synthesis of Single-Walled Carbon Nanotube Networks on Silicon Nanowires
  Published in: PRICM 6 (p1205)
• TEM In-Situ Observation of SiO₂ Doped TZP at High Temperatures
  Published in: Towards Innovation in Superplasticity II (p525)
• Thin Film Carbon Layers with Continously Changing Bonding Properties
  Published in: Materials Science, Testing and Informatics III (p207)