| Paper Title | Page |
|---|---|
|
Developing an Effective and Robust Process for Manufacturing Bipolar SiC Power Devices Authors: Joseph J. Sumakeris, Brett A. Hull, Michael J. O'Loughlin, Marek Skowronski, Vijay Balakrishna |
77 |
|
High Power 4H-SiC PiN Diodes with Minimal Forward Voltage Drift Authors: Mrinal K. Das, Joseph J. Sumakeris, Michael J. Paisley, Adrian R. Powell |
1105 |
|
Temperature Dependence of Shockley Stacking Fault Expansion and Contraction in 4H-SiC p-i-n Diodes Authors: Joshua D. Caldwell, Robert E. Stahlbush, Orest J. Glembocki, Karl D. Hobart, Kendrick X. Liu, Marko J. Tadjer |
273 |
Keyword:
"Forward Voltage Drift"
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