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Articles by keyword: «Grazing Incidence X-Ray Diffractometry (GI-XRD)»

• Characterization of Co-Based Metal Oxide Films on Glass
  Published in: Euro Ceramics VIII (p525)
• Characterization of Plasma Treated Al-Films by GIXR and GIXRD
  Published in: European Powder Diffraction 6 (p406)
• Comparative Studies of Textured Pulsed Laser Deposition and Sol-Gel Growth of Thin Hydroxyapatite Layers on Titanium Substrates
  Published in: Residual Stresses VII, ECRS7 (p885)
• Cubic SiC Surface Structure Studied by X-Ray Diffraction
  Published in: Silicon Carbide and Related Materials - 2002 (p571)
• Growth Behaviour of Aluminium Oxide in O₂ Microwave Plasma
  Published in: European Powder Diffraction EPDIC 7 (p557)
• Influence of Temperature on Nano-Graphene Structuring of PLD Grown Carbon Films - An X-Ray Diffraction Study
  Published in: Diamond and Other New Carbon Materials IV (p55)
• Structural Characterization of Epitaxial Si / Pr₂O₃ / Si(111) Heterostructures
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p741)
• Structure of the 3C-SiC(100) 5x2 Surface Reconstruction Investigated by Synchrotron Radiation Based Grazing Incidence X-Ray Diffraction
  Published in: Silicon Carbide and Related Materials 2006 (p533)