Papers by Keyword: HgCdTe

Abstract: In the paper, the principle, the preparation and the performance of the dual-color infrared HgCdTe detector is introduced. The detector is a combination of different wave band filter and different respond wave band element. The application of the dual-color infrared HgCdTe sensitive element for methane gas detection sensor is developed. A two-element HgCdTe methane detector which responds between 3.13~3.53μm and 3.91~4.09μm wave bands respectively was reported. The performance of each detection channel was presented. The experiment test and analyze are fulfilled. The experiment result indicates that under the refrigeration temperature the dual-color HgCdTe detector not only has a favorable response ability and repetition but also can realize the response and distinguish ability to methane gas through integrate narrow band filter on the front of the detector sensitive element.

Abstract: Surface characteristics of CZT wafers machined using wire sawing, free abrasives lapping and polishing and ultra-precision grinding were investigated. Wire sawing resulted in the removal of material in both ductile and brittle regimes, but both polishing and grinding led to a ductile removal. The grinding produced very smooth surfaces free of embeddings and scratches, which is thus considered to have better machinability than the free abrasive machining. The nanoindentation and nanoscratch on MCT wafers at nanometric scales resulted in considerable plastic deformation, but no fracture features. The hardness of the MCT wafer was 500 to 550 MPa, and the coefficient of friction was particularly high, ranging from 0.45 to 0.55.