| Paper Title | Page |
|---|---|
|
Authors: Bernd Baufeld, Omer Van der Biest |
273 |
|
Authors: Gert Roebben, Omer Van der Biest |
167 |
|
Authors: Gert Roebben, B. Basu, Jef Vleugels, Omer Van der Biest |
787 |
|
Microstructural Differences in Silicon Nitrides with and without a Small Amount of TiN Additive Authors: Ren-Guan Duan, Gert Roebben, C. Sarbu, Jef Vleugels, Omer Van der Biest |
1181 |
|
Recent Advances in Material Characterization Using the Impulse Excitation Technique (IET) Authors: Akhilesh Kumar Swarnakar, S. Giménez, Sedigheh Salehi, Jef Vleugels, Omer Van der Biest |
235 |
|
Authors: Gert Roebben, Omer Van der Biest |
621 |