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Papers by Keyword: Interfaces Semiconductor

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CEMS Analysis of Phase Formation in Nanostructured Films (Fe/Si)₃

Authors: S.N. Varnakov, S.G. Ovchinnikov, Juan Bartolomé, Javier Rubín, L. Badía, G.V. Bondarenko

Abstract: Determination of stable phases formed at the Fe/Si interface in (Fe/Si)n structure, grown by thermal evaporation in an ultrahigh vacuum system was performed using conversion electron Mössbauer spectroscopy (CEMS).

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