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Papers by Keyword: Ion Beam Induced Damage

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Depth Profiling of Defects in Argon Irradiated Silicon Using Positron Beam Facility at Kalpakkam

Authors: G. Amarendra, G. Venugopal Rao, K.G.M. Nair, B. Viswanathan

650

Optical Characterization of Ion Beam Induced Disorder in Semiconductors Irradiated with Heavy Ions

Authors: K.L. Bhatia, P. Singh, N. Kishore

419