Keyword: "LEEM"
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Atomic Crack Defects Developing at Silicon Carbide Surfaces Studied by STM, Synchrotron Radiation-Based μ-spot XPS and LEEM

Authors: P. Soukiassian, F. Amy, Christian Brylinski, T.O. Mentes, A. Locatelli

481

Control of Epitaxial Graphene Thickness on 4H-SiC(0001) and Buffer Layer Removal through Hydrogen Intercalation

Authors: Jawad ul Hassan, Chariya Virojanadara, Axel Meyer, Ivan G. Ivanov, Jan I. Flege, Somsakul Watcharinyanon, Jens Falta, Leif I. Johansson, Erik Janzén

605

Large Area Quasi-Free Standing Monolayer Graphene on 3C-SiC(111)

Authors: Ulrich Starke, Camilla Coletti, Konstantin Emtsev, Alexei A. Zakharov, Thierry Ouisse, Didier Chaussende

617

The Registry of Graphene Layers Grown on SiC(000-1).

Authors: Leif I. Johansson, Somsakul Watcharinyanon, Alexei A. Zakharov, Rositza Yakimova, Chariya Virojanadara

613