Articles by keyword: «Oxide-Trapped Charge»
3 papers on 1 page:
1
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Hall Effect and Admittance Measurements of n-Channel 6H-SiC MOSFETs
Published in: Silicon Carbide and Related Materials 2006 (p791) -
Investigation of Domain Structure and Electrical Properties of Monoclinic Epitaxial Zirconia Buffer Layer
Published in: Electroceramics in Japan VIII (p261) -
Modelling of Radiation Response of p-Channel SiC MOSFETs
Published in: Silicon Carbide and Related Materials - 2002 (p761)