Papers by Keyword: Oxidisation

Abstract: The electronic properties of organic field effect transistors limit the efficiency of integrated circuits build on basis of printed organic semiconductors. In order to control the mobility of high efficient semiconductors, like rubrene, tetracene, tetracyanoquinodimethane (TCNQ), copper phthalocyanine and many others, single-crystal field-effect transistors have been prepared on surfaces of single crystals and characteristics have been measured. The highest mobility has been measured on rubrene single crystals. The mobility of as-grown crystals measured by air-gap field effect transistor is in the range of 10 cm²/Vs but falls below 1 cm²/Vs during reduction. It was observed that the measured mobility depends on the dielectric used for field effect transistors.

Abstract: Oxidization of diamond in the sintering process of diamond/borosilicate glass composites would result in low compressive fracture strength (CFS) of the grit and uncontrolled expansion with many irregular pores in the composites, causing low bending strength of the tools. In this paper diamond/borosilicate glass composites were prepared by cold pressing and sintering at 850 C for 120 min in air. An active element Zn was incorporated into the composites in order to resolve the above issues. The effects of Zn contents on the properties of the composites was investigated by the bending strength tests, the volume expansion rate tests, differential scanning calorimeter test (DSC), thermogravimetry (TG), X-ray diffraction analysis (XRD), and scanning electron microscope (SEM). The results showed Zn was oxidized and then converted to ZnAl2O4 and Zn2SiO4 phases during sintering. The bending strength improved and the expansion phenomenon was inhibited for the composites with various Zn additions. The maximum bending strength and minimum volume expansion rate were obtained for the composite GZ8. This Zn content resulted in a decrease of volume expansion rate from 8.57% to -20.53%, and an increase in bending strength from 28.49 MPa to 74.02 MPa compared with the composite GZ0. The CFS results of the diamond grits separated from GZ0 and GZ8 was 21N and 26N, respectively.

Abstract: In order to understand the influence of gamma-irradiation, accelerated aging and Vitamin-E addition on the fatigue crack growth properties of UHMWPE, fatigue crack growth tests of UHMWPE plates using compact tension specimens were carried out. The specimen conditioned in -irradiation and accelerated aging (the -aging specimen) has faster fatigue crack growth rate than the virgin specimens. For the Vitamin-E added specimen (the VE specimen), however, K threshold of the -aging VE specimen is smaller than that of the VE specimen. This result shows that the addition of Vitamin-E reduced the decrease of K threshold by -irradiation and accelerated aging.

Abstract: Stainless steel is widely used as a corrosion-resistant material. However, stainless steel corrodes at high temperature (573 K ~) due to the oxidization and grain boundary corrosion. To delay the oxidation at high temperature, coating of gas barrier film will be useful method. The purpose of this study is to improve the corrosion-resistant of SUS304 at high temperature by coating transparent SiOxNy film which has gas barrier properties. In addition, the influence of inlet gas mass flow rate ratio (N2/Ar+N2) on the oxidation properties at 773 K was examined. The SiOxNy films were deposited onto polished SUS304 by unbalanced dc magnetron sputtering apparatus. To examine the oxygen transmission rate (OTR) of SiOxNy films, PET was also used as substrate. The results showed that good OTR was obtained for N2/Ar+N2 < 0.12 on PET substrate. The similar tendency was obtained for SUS304 deposited film heated up to 773 K.

Abstract: The spallation of thermal barrier coatings (TBCs) is promoted by thermally grown oxide (TGO). To improve TBCs, it is very important to understand the influence of TGO on the spalling stress. In this study ,the TBCs were oxidized at 1373 K for four diferent periods: 0, 500,1000 and 2000 h. The distribution of the in-plane stress in oxidized TBCs, s1, was obtained by repeating the X-ray stress measurement with low energy X-rays after successive removal of the surface layer. The distribution of the out-of-plane stress, s1− s3, was measured with hard synchrotron X-rays, because high energry X-rays have a large penetration depth. From the results by the low and high energy Xrays, the spalling stress in the oxidized TBCs, s3, was evaluated. The evaluated value of the spalling stress for the oxidized TBC was a small tension beneath the surface, but steeply increased near the interface between the top and bond coating. This large tensile stress near the interface is responsible for the spalling of the top coating.