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Articles by keyword: «Photoelectron Spectroscopy»

• A High-Resolution Photoemission Study of Hydrogen-Terminated 6H-SiC Surfaces
  Published in: Silicon Carbide and Related Materials 2001 (p713)
• Atomic Structure of the (0001) Corundum Surface
  Published in: Defects in Insulating Materials (p633)
• Characterization of Oxide Films on SiC Epitaxial (000-1) Faces by Angle-Resolved Photoemission Spectroscopy Measurements Using Synchrotron Radiation
  Published in: Silicon Carbide and Related Materials 2004 (p585)
• Electronic Structure of Graphite/6H-SiC Interfaces
  Published in: Silicon Carbide and Related Materials 2006 (p701)
• High Resolution Photoemission Study of the 6H-SiC/SiO₂ Interface
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p375)
• Hydrogen-Saturated SiC-Surfaces: Model Systems for Studies of Passivation, Reconstruction and Interface Formation
  Published in: Silicon Carbide and Related Materials 2004 (p535)
• Influence of Temprature Evolution of the Electronic Band Sturcture on Transport Properties in Doped Regioregular Polyalkylthiophenes
  Published in: New Materials (p91)
• Initial Stages of the Graphite-SiC(0001) Interface Formation Studied by Photoelectron Spectroscopy
  Published in: Silicon Carbide and Related Materials 2006 (p525)
• Initial Stages of Thermal Oxidation of 4H-SiC (11-20) Studied by Photoelectron Spectroscopy
  Published in: Silicon Carbide and Related Materials 2003 (p1317)
• Photoemission Spectroscopic Studies on Oxide/SiC Interfaces Formed by Dry and Pyrogenic Oxidation
  Published in: Silicon Carbide and Related Materials 2003 (p1341)
• Photoemission Study of the Silicate Adlayer Reconstruction on Si-terminated 6H-SiC (0001)
  Published in: Silicon Carbide and Related Materials - 1999 (p391)
• Preparation and Characterization of Hydrogen Terminated 6H-SiC
  Published in: Silicon Carbide and Related Materials 2000 (p223)
• Reconstruction of Cleaved 6H-SiC Surfaces
  Published in: Silicon Carbide and Related Materials 2003 (p391)
• Study of Corrosion Protective Lyers on Iron Surfaces by X-Ray Photoelectron- and Moessbauer-Spectroscopic Methods
  Published in: Passivation of Metals and Semiconductors (p357)
• Surface Band Structure Studies of Si Rich Reconstructions on 4H-SiC(1-100)
  Published in: Silicon Carbide and Related Materials 2004 (p547)