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Papers by Keyword: Preferential Sputtering

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Limits of Ion-Beam Depth-Profiling as Used in Diffusion Studies of Oxidation-Sensitive Materials

Authors: H. Ehmler, A. Rehmet, Klaus Rätzke, Franz Faupel

147

Effects of Annealing and Ion Bombardment on Structure and Composition of Ti-Al Alloy Films

Authors: M. Fahoume, M. El Khamlichi, C. Baltzinger, C. Burggraf

391