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Articles by keyword: «Radiotracer»

• Diffusion along Non-Equilibrium Grain Boundaries: Investigation by a Radiotracer Technique
  Published in: Diffusion in Materials DIMAT 1996 (p1481)
• Diffusion and Structure of Defects in Ni-Base Superalloy Single Crystals
  Published in: Diffusion in Materials DIMAT 1996 (p1447)
• Diffusion Measurements in Chromium-Manganese Steels by Means of Multiple Radiotracer Test
  Published in: Diffusion in Materials - DIMAT2004 (p1199)
• Diffusion of Solute Elements in Fe₃Al
  Published in: Diffusion, Segregation and Stresses in Materials (p175)
• Europium Induced Deep Levels in Hexagonal Silicon Carbide
  Published in: Silicon Carbide and Related Materials 2005 (p659)
• Experimental Evidence of Iron Segregation in Copper Grain Boundaries as Deduced from Type B Diffusion Measurements
  Published in: Diffusion in Solids - Past, Present and Future (p161)
• Fast Metal Diffusion in Silicon under Intrinsic and Extrinsic Doping Conditions
  Published in: Diffusion in Materials DIMAT 1996 (p979)
• Identifitcation of Bandgap States in Semiconductors by Transmutation of Implanted Radioactive Tracers
  Published in: Materials Science Applications of Ion Beam Techniques (p113)
• Nickel Self-Diffusion along Grain Boundaries in Ni₃Al-Base Intermetallic Alloys
  Published in: Diffusion in Materials DIMAT 1996 (p1453)
• On the Existence of Deep Levels of the Acceptors Ga and In and of the Potential Double Acceptors Zn and Cd in SiC
  Published in: Silicon Carbide and Related Materials - 1999 (p749)
• Polytype Dependence of Transition Metal-Related Deep Levels in 4H-, 6H- and 15R-SiC
  Published in: Silicon Carbide and Related Materials 2001 (p573)
• Segregation-Controlled Gold Diffusion in Polycrystalline Silicon
  Published in: Diffusion in Materials DIMAT 1996 (p1457)
• Self- and Impurity Diffusion of Ni, Ga, Ge, Ti, Nb and B in the L1₂-Type Intermetallic Compounds Ni₃Al
  Published in: Diffusion in Materials DIMAT 1996 (p245)
• Self-Diffusion in Nickel-Manganese Alloys
  Published in: Diffusion in Materials - DIMAT2004 (p352)
• Tantalum and Tungsten in Silicon Carbide: Identification and Polytype Dependence of Deep Levels
  Published in: Silicon Carbide and Related Materials 2000 (p475)