Papers by Keyword: Sn-2.5Ag-0.7Cu-0.1RE Solder Alloy

Abstract: The morphology and growing behavior of Cu₆Sn₅ intermetallic compound (IMC) of low Ag content Sn-2.5Ag-0.7Cu-0.1RE/Cu solder joint interface are investigated by adopting the X-ray diffraction, JSM-5610LV scanning electronic microscope and energy spectrum analysis. The results show that the cross-section morphology Cu₆Sn₅ of the solder joint interface is scallop-like and its section morphology is circle-like grain. With the aging time increasing, the cross-section Cu₆Sn₅ morphology of the solder joint interface can be changed from the scallop-like to the shape-layer, and the growing kinetics is coincidence with the law of parabola and its growing behavior is controlled by diffusion. With adding a small amount of rare earth elements in the Sn-2.5Ag-0.7Cu solder alloy, the growing rate of the Cu₆Sn₅ can be reduced.