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Articles by keyword: «Time-of-Flight (TOF)»

• A Signal Processing Approach for Elastic Wave-Based Structural Health Monitoring Using Active Piezoelectrics
  Published in: Advances in Composite Materials and Structures (p1141)
• Acoustoelastic Determination of Stresses in Steel Using Rayleigh Ultrasonic Waves
  Published in: Nondestructive Characterization of Materials VII (p171)
• Angular Distribution and Ion Time of Flight Produced on Silicon Target by Laser Irradiation
  Published in: Laser and Plasma Applications in Materials Science (p31)
• Application of Spectroscopic Radiography Using Pulsed Neutron Time-of-Flight Method for Material Characterization
  Published in: Advanced Nondestructive Evaluation I (p1663)
• Characteristics of a New Type Neutron Radiography Using Time-of-Flight Method
  Published in: Advances in Nondestructive Evaluation (p1371)
• Experimental Determination of Shock Hugoniot for Water, Castor Oil, and Aqueous Solutions of Sodium Chloride, Sucrose and Gelatin
  Published in: Explosion, Shock Wave and Hypervelocity Phenomena (p23)
• Heavy Ion Recoil Time of Flight Method for Materials Analysis
  Published in: Materials Science Applications of Ion Beam Techniques (p333)
• Inspection of Inhomogeneities in Carbon/Phenolic Matrix Composite Materials Using NDE Techniques
  Published in: Advances in Nondestructive Evaluation (p1799)
• Laser Characterization of Semiconductors
  Published in: Semiconductor Processing and Characterization with Lasers (p141)
• Measurement of Positronium Emission Energy from Surface of MCP
  Published in: Positron Annihilation - ICPA-12 (p682)
• New Technologies for Submillimeter Laser Ranging
  Published in: Advanced Measurement and Test (p397)
• Numerical Modelling of Transient Transport Properties in Amorphous Semiconductors
  Published in: Hydrogenated Amorphous Silicon (p505)
• On Ultrasonic Characteristics in Carbon/Phenolic Matrix Composite Materials
  Published in: Designing, Processing and Properties of Advanced Engineering Materials (p757)
• Positronium Time-Of-Flight Measurements of Porous Silsesquioxane Films
  Published in: Positron Annihilation - ICPA-13 (p361)
• Temperature Dependence of Drift Mobility in Bismuth Germanium Oxide and Bismuth Silicon Oxide
  Published in: Defects in Insulating Materials (p325)