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New Type of Diffraction Elastic Constants for Stress Determination

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Abstract:

A new method for calculation of the diffraction elastic constants, based on the selfconsistent model, is proposed and tested. This method is especially useful in the interpretation of the results of X-ray measurements since the ellipsoidal inclusion near the sample surface is considered. In X-ray diffraction the information volume of the sample is defined by absorption, causing unequal contribution of different crystallites to the intensity of the measured peak. Consequently, the surface grains participate more effectively in diffraction than the grains which are deeper in the sample.

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Periodical:

Materials Science Forum (Volumes 524-525)

Pages:

235-240

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.524-525.235

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Online since:

September 2006

Authors:

Andrzej Baczmanski, Albert Tidu, Paul Lipiński, Michel Humbert, Krzysztof Wierzbanowski

Keywords:

Diffraction Elastic Constants, Residual Stress, Self-Consistent Model, X-Ray Diffraction (XRD)

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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