Nano and Micro Mechanical Measurement of Interaction Forces Between Solid Surfaces

Kyung Suk Kim

doi:10.4028/www.scientific.net/KEM.326-328.1

Paper Titles

Committees

Preface

Nano and Micro Mechanical Measurement of Interaction Forces Between Solid Surfaces
p.1

Experimental Study on Electro-Magneto-Mechanical Behaviour of Electromagnetic Solids
p.5

Image Processing for Optical Methods to Analyze Shape, Deformation, Stress and Strain
p.13

Development of Phase Shifting Device Using the Deflection of a Cantilever for Digital Holography
p.19

Vibration Analysis of Membrane by Time Average In-Line Digital Holographic Interferometry
p.23

Effect of Phase-Shifting Error on Deformation Evaluation Using Phase-Shifting Digital Holography
p.27

Real-Time Shape Measurement by Unwrapping Method Using Aliasing
p.31

HomeKey Engineering MaterialsKey Engineering Materials Vols. 326-328Nano and Micro Mechanical Measurement of...

Nano and Micro Mechanical Measurement of Interaction Forces Between Solid Surfaces

Abstract:

Two different types of experimental methods have beeen developed for measuring lateral interaction forces between two solid surfaces for nano- and micro-meter scale contacts. One is the type of direct measurement methods which typically utilize AFM instrumentations. In the direct lateral force measurements some size-scale effects are commonly observed due to the effects of adhesion and surface roughness. A recent development of a fine AFM lateral force calibration method, a diamagnetic lateral force calibrator, has made it possible to study such size-scale effects systematically. The other type is the field projection method which requires a high resolution measurement of a deformation field near the edge of a contact. For such measurements a comprehensive map of deformation measurement techniques is introduced in a domain of spatial and strain resolutions. This technique provides a way of assessing the non-uniform distribution of the surface interaction forces for nano and micro-meter scale contacts.