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HomeMaterials Science ForumMaterials Science Forum Vols. 404-407Global X-Ray Method for the Determination of...

Global X-Ray Method for the Determination of Stress Profiles

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Residual Stresses VI, ECRS6

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Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

19-24

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.19

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Online since:

August 2002

Authors:

Jean Michel Sprauel, H. Michaud

Keywords:

Four-Point Bending, Shot Peening, Stress Profile, X-Ray

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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