Paper Titles
Preface
Grain Surface Relaxation and Grain Interaction in Powder Diffraction
p.1
Fundamental Developments in Direct-Space Techniques for Structure Solution from Powder Diffraction Data
p.11
Completion of Crystal Structure with Polyhedral Coordination: A New Procedure
p.23
Calibration of Diffractometers: A Test Method to Monitor the Performance of Instruments
p.27
Standardisation of X-Ray Powder Diffraction Methods
p.31
FOX: Modular Approach to Crystal Structure Determination from Powder Diffraction
p.35
X-Ray Powder Diffraction Study of Atomic Structure of Nanocrystalline SiC and Diamond Materials
p.39
Quantitative Phase Analysis Using the Rietveld Method - Estimates of Possible Problems Based on Two Interlaboratory Comparisons
p.45

Grain Surface Relaxation and Grain Interaction in Powder Diffraction

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Abstract:

The role of grain surfaces and interfaces in nanocrystalline materials is investigated by X-ray diffraction (XRD). Two apparently distinct aspects show the importance of the interaction of a single grain with the environment in which it is placed: the role of grain-grain interaction in determining the residual stress in a polycrystalline thin film and the surface effects in single powder grains on the macroscopic average cell parameter determined by powder diffraction. A brief theoretical introduction of the phenomena and their possible modelling is presented together with a discussion of practical examples.

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Periodical:

Materials Science Forum (Volumes 443-444)

Pages:

1-10

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.443-444.1

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Online since:

January 2004

Authors:

Matteo Leoni

Keywords:

Grain Interaction, Grain Surface Relaxation, Nanocrystal, Residual Stress, X-Ray Diffraction (XRD)

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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