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HomeMaterials Science ForumMaterials Science Forum Vols. 445-446Spatially Resolved Detection of Point Defects in...

Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe

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Periodical:

Materials Science Forum (Volumes 445-446)

Pages:

510-512

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.445-446.510

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Online since:

January 2004

Authors:

T.E.M. Staab, C. Zamponi, M. Haaks, I. Müller, S. Eichler, Karin Maier

Keywords:

Brittle-to-Ductile Transition, GaAs, Mircobeam, Positron Microprobe, Scratches

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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