Paper Titles
Preface
An Assessment of the Current State and Future Challenges in Quantitative NDE
p.1
Ultrasonic Characterization of Thin Film Material Constants and Defects
p.8
Ultrasonic Guided Waves in Structural Health Monitoring
p.14
Investigation of Magnetic Characteristics for a FeCo/Si Multilayer with the Variation of the Bias Potential at Substrate
p.22
3D Modeling of Porous Ceramics by High-Resolution X-Ray CT for Stress Analyses
p.28
Residual Stress Assessment in API X65 Pipeline Welds by Non-Destructive Instrumented Indentation
p.35
A Method for Quantitative Evaluation of Electrical Conductivity of Silicon Wafers by Millimeter-Waves
p.41
Bending Behavior of Thin-Walled Cylindrical Tube Filled with Aluminum Alloy Foam
p.46

Ultrasonic Characterization of Thin Film Material Constants and Defects

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Periodical:

Key Engineering Materials (Volumes 270-273)

Pages:

8-13

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.270-273.8

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Online since:

August 2004

Authors:

Jan D. Achenbach

Keywords:

Acoustic Microscopy, Laser-Based Ultrasonics, Material Property, Measurement Models, Thin Film

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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