Approximate Analytical Formulae to Evaluate the Uncertainty in X-Ray Stress Analysis

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Abstract:

The global uncertainty, in X-ray stress analysis, is due to many factors but one of the most important is the uncertainty on peak positions due to counting statistics and other random errors on peak positions. Although a lot of work has been done to estimate the latter, very little work has been devoted to its propagation through the least square regression. This work presents some analytical results in the general case of triaxial stress state (elliptic curve fit) and proposes approximate formulae to easily compute the uncertainty on normal and shear stress components from acquisition parameters such as the number N of y tilts and the maximum y value. It was found that the latter only influences significantly the uncertainty on the normal stress component and that the dependency of the uncertainty on N does not necessarily follow a 1/ N relation.

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Materials Science Forum (Volumes 490-491)

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124-124

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July 2005

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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[1] Noyan I.C., Cohen J.B. : Residual Stress, Measurement by Diffraction and Interpretation (Springer-Verlag, Berlin, 1987).

Google Scholar

[2] Lu J. (editor) : Handbook of measurement of residual stresses (Soc. For Experimental Mechanics, The Fairmont Press Inc. 1996).

Google Scholar

[3] Convert F., Miège B., The control of geometrical sources of error in X-ray diffraction applied to stress analysis, (1992), J. Appl. Cryst 25, 384-390.

DOI: 10.1107/s002188989101422x

Google Scholar

[4] Sprauel J.M. : Etude par diffraction X des facteurs mécaniques influençant la corrosion sous contraintes d'aciers inoxydables, Thesis, University Paris 6, 16 June (1988).

Google Scholar

[5] Sprauel J.M., Barrallier L. : Utilisation d'outils statistiques pour l'évaluation des contraintes par diffractométrie X, Siemens X-ray users' meeting, vol. 2, Paris, April (1992).

Google Scholar

[6] François M., Bourniquel B., Not C., Guillén R., Duval C., Parameters influencing peak localization repeatability for X-ray stress measurements - use of experiment designs technique, Zeitschrift für metallkunde, 91 (2000) 5, 414-420.

Google Scholar

[7] Rabinovich S.G.: Measurement errors and uncertainties, theory and practice (Springer Verlag, New York 2000).

Google Scholar

[8] Lira I.: Evaluating the measurement uncertainty : fundamentals and practical guidance (Institute of Physics Publishing, Bristol, 2002).

Google Scholar

[9] François M., Ferreira C., Guillén R., Effects of temperature fluctuations on X-ray stress determination, Proc. of ICRS7, Xi'An, People's Republic of China, June 14-17, (2004).

Google Scholar

[10] François M., Ferreira M., Guillén R., Expression de l'incertitude lors de la mesure de contraintes résiduelles par diffraction, RX 2003, Strasbourg, 9-11 décembre (2003).

DOI: 10.1051/jp4:2004118012

Google Scholar

[11] ISO, Guide to the expression of uncertainty in measurement, 1993, Geneva, Switzerland: International Organisation for Standardisation.

Google Scholar

[12] Kirkup L., A guide to GUM, Eur. J. Phys. 23 (2002) 483-487.

Google Scholar

[13] Fry T., Kandil F.A., A study of parameters affecting the quality of residual stress measurements using XRD, Mat. Science Forum, vols 404-407 (2002) 579-586.

DOI: 10.4028/www.scientific.net/msf.404-407.579

Google Scholar

[14] François M., Convert F., Branchu S., French round-robin test on X-ray stress determination on a shot-peened steel, Experimental Mechanics, vol 40, n°4, 2000, 361-368.

DOI: 10.1007/bf02326481

Google Scholar

[15] François M., Ferreira C., Botzon R., Reference specimens for X-ray stress analysis, the French experience, Metrologia 41 (2004), 33-40.

DOI: 10.1088/0026-1394/41/1/005

Google Scholar