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Detection of Random Defects on Highly Reflective and Complex Surfaces

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Abstract:

This paper describes a system that detects and categorizes workpieces with random defects on electrodeposits glossy metal surface. The system is developed on the basis of combination CCD photoelectricity inspection technology, image processing and automatic control technology. In the system, a special illumination apparatus with a light source of diffused light is designed. Workpieces with defects are automatically selected through measurement with image enhancement retreatment, gray scale analysis, image binaryzation, feature extraction and image recognition. Hardware comprises sections of optics, image collection, and control circuits. Software is programmed in Visual C++ and assembly language. The system can resolve the difficulty of detecting random defects on surface under the conditions of high reflection and complex surfaces.

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Periodical:

Key Engineering Materials (Volumes 295-296)

Pages:

233-238

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.295-296.233

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Online since:

October 2005

Authors:

Xing Hua Qu, Y. He, G.X. Jia, J.M. Ding, S.H. Ye

Keywords:

CCD Inspection, Defects on Surface, Electrodeposits Surface, Image Processing, Uniform Scatter Light

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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