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HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64Characterization of Laser-Irradiated CdxHg1-xTe...

Characterization of Laser-Irradiated Cd_xHg_1-xTe Solid Solutions by Scanning Microscopy Method

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Beam Injection Assessment of Defects in Semiconductors

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Periodical:

Solid State Phenomena (Volumes 63-64)

Pages:

353-360

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64.353

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Online since:

December 1998

Authors:

V.A. Gnatyuk

Keywords:

Electron Microscopy, Elemental Composition, Graded Band-Gap Layer, Laser Irridation, Optical Microscopy, Raman Scattering Spectra, X-Ray Diffractometry, X-Ray Topography

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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