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HomeSolid State PhenomenaSolid State Phenomena Vols. 63-64Scanning Acoustic Microscopes for the...

Scanning Acoustic Microscopes for the Investigation of Ferroelectric Properties of Materials

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Beam Injection Assessment of Defects in Semiconductors

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Periodical:

Solid State Phenomena (Volumes 63-64)

Pages:

361-368

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.63-64.361

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Online since:

December 1998

Authors:

Xing Gang Liu, L.J. Balk, G. Shafirstein, A. Eckau, Qing Rui Yin

Keywords:

Atomic Force Microscope (AFM), BaTiO₃, Ferroelectric Domain, SEAM

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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