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Simulation of the Oriented Crystallisation of Cu/Pd(001) Amorphous Film

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Abstract:

Crystallisation processes of amorphous Cu-film on Pd(001) substrate have been investigated by molecular dynamics method. It has been established that the formed structure has tetragonal distortions; the elastic stresses caused by dimensional misfit of crystal lattices of the substrate and the film lead to the formation of complex defect structure changing during the annealing.

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Periodical:

Solid State Phenomena (Volume 115)

Pages:

311-314

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.115.311

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Online since:

August 2006

Authors:

A.A. Dmitriev, Alexander V. Evteev, V.M. Ievlev, A.T. Kosilov, Elena V. Levchenko

Keywords:

Computer Simulation, Defect, Interface, Thin Film

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© 2006 Trans Tech Publications Ltd. All Rights Reserved

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