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Low Temperature Self-Diffusion of Iron in the 56Fe/57Fe Stable-Isotope Thin-Film System

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Abstract:

Low-temperature diffusion in thin films of the stable isotopes, 56Fe/57Fe, was studied by applying secondary ion mass spectrometry (SIMS). Processing of the concentration profiles obtained was done by using the Hall – Morabitto “median gradient” method. The bulk and intergrain selfdiffusion coefficients were determined.

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Periodical:

Defect and Diffusion Forum (Volumes 261-262)

Pages:

85-92

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.261-262.85

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Online since:

January 2007

Authors:

Mykhaylo Vasylyev, Sergey I. Sidorenko, S.M. Voloshko, V. Kostiuchenko, I.E. Kotenko

Keywords:

Depth Profile, Self-Diffusion, SIMS, Stable Isotope, Thin Film

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© 2007 Trans Tech Publications Ltd. All Rights Reserved

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