Paper Title:
AOI Techniques for Surface Defect Inspection
  Abstract

Recent years, automated optical inspection (AOI) is developed very fast along with the rapid development of the emerging industries of semiconductor, LCD, PCB, optical communication and precision assembly, and also widely used in the industries of robot, automobile, steel, textile, printing, medicine, etc. In this paper, we will take a review of the AOI techniques, which are used for defect inspection on a large surface, such as inspecting the quality of TFT-LCD glass substrate and filter. The AOI system architecture having high inspection speed is illustrated. Some key techniques of light illumination, distributed image processing and convey mechanism, are explained.

  Info
Periodical
Edited by
Yusaku Fuji and Koichi Maru
Pages
297-302
DOI
10.4028/www.scientific.net/AMM.36.297
Citation
R. S. Lu, Y. Q. Shi, Q. Li, Q. P. Yu, "AOI Techniques for Surface Defect Inspection", Applied Mechanics and Materials, Vol. 36, pp. 297-302, 2010
Online since
October 2010
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$32.00
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