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European Powder Diffraction

Materials Science Forum Volumes 79 - 82

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• p119 A Correction for Truncation of Powder Diffraction Line Profiles   [ 299 K ]
  Authors: Arnold C. Vermeulen, Rob Delhez, T.H. de Keijser, Eric J. Mittemeijer
• p125 Comparison of Single- and Multiple-Peak Methods for the Determination of Crystallite Size and Lattice Strain using Pseudo-Voigt Functions   [ 193 K ]
  Authors: Nikolay Zotov
• p131 X-Ray Powder Diffraction Data Reduction by Integrating the Wilson and the Warren-Averbach Theories   [ 356 K ]
  Authors: Giovanni Berti
• p139 Simulation of Diffraction Patterns from Small Bimetallic Crystals with Concentration Gradient   [ 146 K ]
  Authors: J. Pielaszek, J. Barczynska
• p143 X-Ray Stress Analysis   [ 377 K ]
  Authors: Jean Michel Sprauel, L. Castex
• p153 Influence of PSI- and OMEGA-Tilting on X-Ray Stress Analysis   [ 211 K ]
  Authors: S. Fischer, E. Houtman, H.R. Maier
• p159 Non-Destructive Stress Measurement with Depth Resolution   [ 172 K ]
  Authors: M. Härting, G. Fritsch
• p165 Determination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray Diffraction   [ 121 K ]
  Authors: H.-G. Brühl, H. Rhan
• p169 Preferred Orientation in Powder Diffraction   [ 319 K ]
  Authors: Hans Joachim Bunge
• p179 Texture Analysis of Multi-Phase Materials by Neutron Diffraction   [ 232 K ]
  Authors: Heinz Günter Brokmeier
• p185 Extinction in Texture Analysis   [ 233 K ]
  Authors: A. Mücklich, P. Klimanek
• p191 Method of Scanning of Reciprocal Space of Axial Textures and its Applications to Structural Investigations   [ 242 K ]
  Authors: G.A. Krinari, Z.J. Halitov
• p197 On the Use of Rietveld Refinements for Structural Studies   [ 441 K ]
  Authors: P.-E. Werner
• p207 The Two-Step-Method and its Applications in Crystallographic Problems   [ 498 K ]
  Authors: Georg Will
• p221 Sign Determination from Powder Diffraction Data of CuSo₄ · 5H₂O   [ 182 K ]
  Authors: W. Limper, W. Prandl, Thomas Wroblewski