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European Powder Diffraction

Materials Science Forum Volumes 79 - 82

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• p227 Fourier Maps Obtained from Powder Diffraction Data - Applications Beyond Pure Illustration   [ 311 K ]
  Authors: S. Jantsch, J. Ihringer, W. Prandl, H. Ritter
• p233 Influence of Crystallite Size and Microstain on Structure Refinement   [ 239 K ]
  Authors: Paolo Scardi, Luca Lutterotti, R. Di Maggio, P. Maistrelli
• p239 Crystal Size Dependent Anisotropic Line Broadening in Rietveld X-Ray Analysis   [ 251 K ]
  Authors: R. Millini, G. Perego, S. Brückner
• p245 A Theta-Dependent Error Present in Powder Data of Highly Absorbing Materials: A Surface Roughness Effect?   [ 271 K ]
  Authors: N. Masciocchi, H. Toraya, W. Parrish
• p251 Qualitative XRPD Analysis System   [ 265 K ]
  Authors: V. Pivoriunas
• p257 Qualitative X-Ray Phase Analysis on the Basis of the Calculated Standards   [ 278 K ]
  Authors: A.V. Chichagov
• p263 Program Package COMPHYS for IBM PC   [ 181 K ]
  Authors: M.S. Nakhmanson
• p267 Solution of Nontraditional Problems Based upon PDF-2   [ 117 K ]
  Authors: M.S. Nakhmanson
• p271 Database for Qualitative X-Ray Diffraction Phase Analysis of Natural Materials   [ 247 K ]
  Authors: E.K. Vasil'ev
• p277 GUFI-WYRIET: An Integrated PC Powder Pattern Analysis Package   [ 261 K ]
  Authors: J. Schneider, Robert E. Dinnebier
• p283 MRIA - A Program for a Full Profile Analysis of Powder Neutron-Diffraction Time-of-Flight (Direct and Fourier) Spectra   [ 200 K ]
  Authors: V.B. Zlokazov, V.V. Chernyshev
• p289 Numerical Refinement of Lattie Parameters: Monoclinic Case   [ 172 K ]
  Authors: W. Paszkowicz
• p295 Thermal Coefficient of Expansion (TCE)-Program for Calculation of TCE's for Single Crystals of all Systems   [ 129 K ]
  Authors: R.A. Dilanyan, B.Zh. Narymbetov, L.A. Novomlinski
• p299 Database for the Structural Problems of High Temperature Superconductors   [ 111 K ]
  Authors: E.A. Gamazova, L.A. Novomlinski
• p303 PULPLOT - A PC Routine for the Graphic Representation and Superimposition of X-Ray Powder Diffraction Patterns   [ 107 K ]
  Authors: Walter Lengauer