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Papers by Author: A. Wiedenhofer

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Reliability and Degradation of Metal-Oxide-Semiconductor Capacitors on 4H- and 6H-Silicon Carbide

Authors: Michael Treu, Reinhold Schörner, Peter Friedrichs, Roland Rupp, A. Wiedenhofer, Dietrich Stephani, Heiner Ryssel

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Growth of SiC Epitaxial Layers in a Vertical Cold Wall Reactor Suited for High Voltage Applications

Authors: Roland Rupp, A. Wiedenhofer, Peter Friedrichs, Dethard Peters, Reinhold Schörner, Dietrich Stephani

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