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Articles by author: C. Jeynes

• Characterization of As Implanted Silicides by Frequency Noise Level Measurements
  Published in: Advanced Materials and Processes (p153)
• PAC-Study of Ternary Compound Formation by Ion Implantation
  Published in: Defects in Semiconductors 15 (p1217)
• Photoluminescence and Backscattering Characterization of 6H SiC Implanted with Erbium and Oxygen Ions
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p501)
• The Effects of Implanted Arsenic on Ti-Silicide Formation
  Published in: Special Defects in Semiconducting Materials (p147)