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Articles by author: C. Lee

• Analytical Expressions for the Length of Stacking Faults during Thermal Nitridation of Oxidized Silicon and Silicon
  Published in: Diffusion in Silicon (p205)
• Defect Study of Heavily n-Type Doped III-V Compound Semiconductors by Means of Pulsed Positron Beam Measurement
  Published in: Positron Annihilation - ICPA-11 (p701)
• Persistent Photoconductivity in Hydrogenated Amorphous Silicon
  Published in: Hydrogenated Amorphous Silicon (p475)
• Spectroscopic and Electrochemical Investigations of Selected Aromatic and Heteroaromatic Compounds in Ambient Temperature Chloroaluminate Melts
  Published in: Molten Salt Chemistry and Technology (p25)