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Papers by Author: C. Lee

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Analytical Expressions for the Length of Stacking Faults during Thermal Nitridation of Oxidized Silicon and Silicon

Authors: N.K. Chen, K.C. Yu, C. Lee

205

Defect Study of Heavily n-Type Doped III-V Compound Semiconductors by Means of Pulsed Positron Beam Measurement

Authors: Yang Koo Cho, J.Y. Leem, C. Lee, S.K. Noh, Ryoichi Suzuki, T. Odaira, Tomohisa Mikado

701

Persistent Photoconductivity in Hydrogenated Amorphous Silicon

Authors: C. Lee

475

Spectroscopic and Electrochemical Investigations of Selected Aromatic and Heteroaromatic Compounds in Ambient Temperature Chloroaluminate Melts

Authors: J.E. Coffield, S.P. Zingg, K.D. Sienerth, S. Williams, C. Lee, G. Mamantov, G.P. Smith

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