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Papers by Author: Christoph Seitz

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[01-15] Grown 6H-SiC Bulk Crystals Investigated by High Energy Triple Axis X-Ray Diffraction

Authors: Christoph Seitz, Z.G. Herro, Boris M. Epelbaum, Albrecht Winnacker, Rainer Hock, Andreas Magerl

Abstract: A structural characterisation of the first [01-15] grown 6H SiC crystals is presented. They show a different micro domain structure outside the facetted region as compared to conventionally [0001] grown crystals. It is imposed by the reduced rotational symmetry for this direction which favours the activation of a low number of glide systems.

307

In-Situ Er-Doping of SiC Bulk Single Crystals

Authors: Ralf Müller, Patrick Desperrier, Christoph Seitz, Matthias Weisser, Andreas Magerl, Manfred Maier, Albrecht Winnacker, Peter J. Wellmann

723

Structural Defects in SiC Crystals Investigated by High Energy X-Ray Diffraction

Authors: Matthias Weisser, Christoph Seitz, Peter J. Wellmann, Rainer Hock, Andreas Magerl

339

Natural Crystal Habit and Preferential Growth Directions during PVT of Silicon Carbide

Authors: Z.G. Herro, Boris M. Epelbaum, Matthias Bickermann, Pierre M. Masri, Christoph Seitz, Andreas Magerl, Albrecht Winnacker

111

High-Accuracy Lattice Constant Measurements of Electron-Irradiated 6H-SiC Single Crystals

Authors: Christoph Seitz, Al. Rempel, Andreas Magerl, M. Gomm, W. Sprengel, Hans Eckhardt Schaefer

289

X-Ray Diffraction Line Profile Analysis of Neutron Irradiated 6H-SiC

Authors: Christoph Seitz, Andreas Magerl, Hans Heissenstein, Reinhard Helbig

287