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Papers by Author: D. Knoll

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Impact of Defects on the Leakage Currents of Si/SiGe/Si Heterojunction Bipolar Transistors

Authors: D. Wolansky, G.G. Fischer, D. Knoll, D. Bolze, Bernd Tillack, P. Schley, Y. Yamamoto

249

Defect Formation and Lateral Oxidation during Locos Processing

Authors: D. Knoll, T. Grabolla, K.-E. Ehwald

93