Papers by Author: D.V. Marin

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Abstract: Ge nanocrystals (NCs) in GeO2 films obtained with the use of two methods were studied. The first method is a film deposition from supersaturated GeO vapor with subsequent dissociation of metastable GeO on heterophase system Ge:GeO2. The second method is growth of anomalous thick native germanium oxide layers with chemical composition GeOx(H2O) during catalytically enhanced Ge oxidation. The obtained films were studied with the use of photoluminescence (PL), Raman scattering spectroscopy, high-resolution electron microscopy (HREM). Strong PL signals were detected in GeO2 films with Ge-NCs at room temperature. “Blue-shift” of PL maximum was observed with reducing of Ge excess in anomalous thick native germanium oxide films. Also a correlation between reducing of the NC sizes (estimated from position of Raman peaks) and PL “blue-shift” was observed. The Ge NCs presence was confirmed by HREM data. The optical gap in Ge-NCs was calculated with taking into account quantum size effects and compared with the position of the experimental PL peaks. It can be concluded that a Ge-NC in GeO2 matrix is a quantum dot of type I.
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Abstract: Silicon nanopowders were produced using electron-beam-induced evaporation of bulk silicon ingots in various gas atmosphere. Optical properties of the nanopowders were studied with the use of photoluminescence and Raman spectroscopy techniques. Photoluminescence peaks in the visible region of the spectrum have been detected at room temperature in silicon nanopowders, produced in argon gas atmosphere. Strong short-wavelength shift of the photoluminescence peaks can be result of quantum confinement effect for electrons and holes in small silicon nanocrystals (down to 2 nm in diameter). The size of silicon nanocrystals was estimated from Raman spectroscopy data. The calculated in frame of effective mass model optical gaps for silicon nanocrystals of spherical shape are in good correlation with experimental photoluminescence data. The attempts of deposition of silicon nanocrystal films from the nanopowders on silicon substrates were carried out.
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Abstract: The laser assisted formation of silicon nanocrystals in SiNx films deposited on quartz and silicon substrates is studied. The Raman spectroscopy revealed creation of the Si cluster and crystallite after excimer laser treatments. Photoluminescence signal from the samples was detected at room temperatures. I-V and C-V measurements were carried out to examine carries transfer through dielectrics film as well as recharging of electronics states.
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