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Articles by author: Daniela Cavalcoli

• Analysis of Σ=3 and Σ=9 Twin Boundaries in Three-Crystal Silicon Ingots
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p455)
• Characterisation of Surface and Near-Surface Regions in High-Purity Cz Si
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p747)
• Electrical Characterization of As-Grown and Thermally Treated 8'' Silicon Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p143)
• Electronic States in Plastically Deformed Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p211)
• Hydrogenated Nanocrystalline Silicon Thin Films Studied by Scanning Force Microscopy.
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p547)
• Investigation on Electrical Contacts on N-Type Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p529)
• Minority Carrier Diffusion Lengths in Multi-Crystalline Silicon Wafers and Solar Cells
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p205)
• On the Interaction of Dislocations with Impurities in Silicon
  Published in: Defects and Diffusion in Semiconductors - an Annual Retrospective VIII (p15)
• Properties of Dislocations and Point Defects in Fz-Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p319)