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Articles by author: F. Pászti

• Charge Carrier Lifetime Modificaiton in Silicon by High Energy H⁺, He⁺ Ion Implantation
  Published in: Materials Science Applications of Ion Beam Techniques (p101)
• Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry
  Published in: Materials Science Applications of Ion Beam Techniques (p373)
• Macroscopic Surface Deformations on Ni Single Crystal Induced by High Dose MeV Energy He Implantation
  Published in: Physics of Irradiation Effects in Metals (p757)
• Optical and Structural Characterization of Erbium-Doped Ion-Implanted Tellurite Glasses for Active Integrated Optical Devices
  Published in: Smart Optics (p68)