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Articles by author: H. Göbel

• Hydrogen Loss and Interdiffusion in Amorphous Si/SiC Multlayers
  Published in: European Powder Diffraction (p887)
• Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements
  Published in: Textures of Materials - ICOTOM 10 (p159)
• Rietveld Refinement of the Phase of NH₄NO₃ Measured In-Situ under Different Diffraction Geometries
  Published in: European Powder Diffraction 3 (p489)
• X-Ray Powder Diffractometer with an Elliptic Focusing Göbel Mirror and Debye Scherrer Geometry
  Published in: European Powder Diffraction EPDIC 7 (p229)