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Articles by author: H. Rücker

• Characterization of MBE Grown Si/Si_1-xGe_x/Si Structures Using n⁺p-Diodes
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p595)
• Optical Investigation of Ge-Rich Ge_1-xSi_x (0≤ x ≤ 0.1) Alloys
  Published in: Defects in Semiconductors 19 (p109)
• X-Ray Diffraction Studies of the Influence of Substitutional Carbon on Si/Ge Interdiffusion in SiGe/Si Superlattices
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p203)