Papers by Author: H. Stanzl

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Critical Thickness Determination of II-VI Semiconductors by Rheed and X-Ray Diffraction
Authors: D. Reisinger, M.J. Kastner, K. Wolf, H. Steinkirchner, W. Häckl, H. Stanzl, W. Gebhardt
147
MOVPE of ZnSE and Zn(S,Se) for Blue LEDs
Authors: W. Gebhardt, H. Stanzl, T. Reisinger, G. Schötz, M. Kastner
105
Analysis of Doping in ZnSe and ZnSSe by Far-Infrared Reflectance under Oblique Incidence
Authors: J. Hermans, V. Offermann, J. Woitok, J. Geurts, H. Stanzl, W. Gebhardt
73
Phase Matched Second Harmonic Generation in ZnTe Optical Waveguides
Authors: H.P. Wagner, S. Wittmann, H. Schmitzer, H. Stanzl
319
Investigations of the Hydrostatic Pressure Dependence of the E0 + Δ0 Gap, the Excitonic Binding Energy and the Refractive Index of Epitaxial ZnSe layers
Authors: G.F. Schötz, Erich Griebl, H. Stanzl, T. Reisinger, W. Gebhardt
271
HRXRD Investigations on Epitaxially Grown ZnTe, ZnSe and ZnSeTe Layers
Authors: K. Wolf, M. Kastner, H. Stanzl, W. Gebhardt
19
Spatial Confinement of Misfit Dislocations at the Interfaces of Epitaxial CdSe/GaAs(111) and ZnTe/GaAs(111) Studied by TEM
Authors: A. Rosenauer, H. Stanzl, K. Wolf, S. Bauer, M. Kastner, M. Grün, W. Gebhardt
567
Incorporation and Interaction of Hydrogen with Acceptor Impurities in II-VI Semiconductor Compounds
Authors: L. Svob, Y. Marfaing, B. Clerjaud, D. Côte, D. Ballutaud, B. Theys, R. Druilhe, W. Kuhn, H. Stanzl, W. Gebhardt
447
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