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Articles by author: Hideaki Niimi

• Differences between Interfacial Bonding Chemistry at SiC-SiO₂ Interfaces Prepared by Low-Temperature Remote Plasma-Assisted Oxidation and High Temperature Conventional Thermal Oxidation
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p1021)
• Material Design for High Strength NTC Thermistor Ceramics
  Published in: Electroceramics in Japan X (p229)
• The Kelvin Probe Force Microscopy Measurement of Degraded Multilayer Ceramic Capacitors with Ni Inner Electrode
  Published in: Electroceramics in Japan XIV (p47)