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Articles by author: Horst P. Strunk

• Cathodoluminescence Measurements and Thermal Activation of Rare Earth Doped (Tb³⁺, Dy³⁺ and Eu³⁺) a-SiC Thin Films Prepared by rf Magnetron Sputtering
  Published in: Silicon Carbide and Related Materials 2005 (p663)
• Cathodoluminescence Studies of Cu(In,Ga)Se₂ Thin-Films
  Published in: Polycrystalline Semiconductors VII (p133)
• Defect Structure of Multicrystalline Chemical Vapor Deposited Silicon Films
  Published in: Polycrystalline Semiconductors III (p381)
• Electrical and Structural Properties of Solution Grown Silicon Layers on Polycrystalline Silicon Substrates
  Published in: Polycrystalline Semiconductors IV (p143)
• Formation and Annihilation of New Donors in Ribbon Growth on Substrate Silicon
  Published in: Polycrystalline Semiconductors V (p33)
• Formation of Misfit Dislocation Networks in Ge/Si as Dependent on the Substrate Orientation
  Published in: Polycrystalline Semiconductors III (p41)
• Formation of Pyramidal Pits at the Interface of 3C-SiC and Si(001) Substrates Grown by Gas Source MBE
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p247)
• Growth and Defect Formation in Thin Ge and Si_0.8Ge_0.2 Layers Ion Beam Sputter Deposited on Si(001)
  Published in: Polycrystalline Semiconductors IV (p193)
• Growth of 3C-SiC Bulk Material by the Modified Lely Method
  Published in: Silicon Carbide and Related Materials 2003 (p151)
• Growth of Highly <100>-Oriented Crystalline Silicon Thin Films on Molybdenum by Pulsed dc Magnetron Sputtering
  Published in: Polycrystalline Semiconductors VII (p287)
• Homoepitaxial Growth of 6H SiC on Single Crystalline Spheres
  Published in: Silicon Carbide and Related Materials - 1999 (p193)
• Ion Beam Sputter Deposited Si_0.8Ge_0.2Epilayers: Lattice Defects and Surface Topology
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p431)
• Laser-Crystallisation of Amorphous Si Layers and Two-Dimensional Simulations of the Process Dynamics
  Published in: Polycrystalline Semiconductors VI (p187)
• Liquid Phase Epitaxy of SiGe Structures
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p385)
• Low-Temperature Epitaxy on Polycrystalline Silicon Substrates
  Published in: Polycrystalline Semiconductors VII (p121)