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Papers by Author: I.E. Bondarenko

Paper TitlePage

Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers

Authors: O.V. Kononchuk, I.E. Bondarenko, George A. Rozgonyi

61

Reconstruction of the Recombination Centre Distribution in Dislocation Impurity Atmosphere in Si

Authors: I.E. Bondarenko, O.V. Kononchuk, V. Sirotkin

123

EBIC-Investigation of the Dislocation-Impurity Interaction in Silicon

Authors: I.E. Bondarenko, Eugene B. Yakimov

59

The Electrical Activity of Dislocation Slip Planes in Semiconductor Crystals

Authors: Eugene B. Yakimov, I.E. Bondarenko, Nikolai Yarykin

787