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Papers by Author: I. Fusegawa

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Reduction of the Barrier Height and Enhancement of Tunneling Current of Titanium Contacts Using Embedded Au Nano-Particles on 4H and 6H Silicon Carbide

Authors: Sang Kwon Lee, Carl Mikael Zetterling, Mikael Östling, I. Fusegawa, M.H. Magnusson, K. Deppert, L.-E. Wernersson, L. Samuelson, A. Litwin

937

Review of the Influence of Micro Crystal Defects in Silicon Single Crystals on Gate Oxide Integrity

Authors: I. Fusegawa, K. Takano, Kaoru Kimura, N. Fujimaki

1683

Measurement of Interstitial Oxygen Striations in Silicon Single Crystals Using the Micro-FTIR Method

Authors: E. Iino, I. Fusegawa, H. Yamagishi

189